- Atomic Layer Deposition
- MOCVD
- Furnace
- Dielectric Etch
- Spray Processing
- Dielectric Etch (including ALE)
- Wet Stations
1. Move in to top 3 spot in ALD2. Take number 2 spot in Furnace business
1. Move in to top 3 spot in ALD2. Take number 2 spot in Furnace business
·
(1) shows
the evolution of transistor architectures from planar, to FinFETs, to
nanoribbons and to a 3D CMOS architecture.
·
(2) (a)
shows a 3D schematic diagram of stacked CMOS Si nanoribbon transistors with
NMOS on PMOS, (b) describes the process flow; (c) is a TEM image of a stacked
multiple-nanoribbon CMOS inverter with a 40-nm gate length and inner (Vss)
and outer (Vcc) contacts, a common gate input (VIN) and
an inverter output node (VOUT); while (d) is a TEM image of two Si
NMOS nanoribbons atop 3 Si PMOS nanoribbons.
·
(3) (a)
is a process flow of the vertically stacked dual S/D EPI process, while (b)
shows P-EPI selectively grown on the bottom three nanoribbons, (c) shows N-EPI
selectively grown on the top two nanoribbons, and (d) features TEM and EDS
images showing selective N-EPI and P-EPI growth on the stacked nanoribbon
transistors.
·
(4)
(a) is a process flow of the vertically stacked dual metal gate process; (b) is
a TEM image and (c, d) are EDS images of the dual metal gate with N-WFM (WFM =
work function metal) on the top two nanoribbons and P-WFM on the bottom three
nanoribbons.
When : 25.11.–26.11.2020
Where: The event will be held in Zoom
Registration : Registration period: 21.10.2020 12:00 – 11.11.2020 12:00
2020 ALD November Networking Event page
Register here! (Without presentation DL 22.11.)
At Aalto University, many research groups' activities have a connection to atomic layer deposition (ALD). Join our public webinar and local networking event on 25.-26.11.2020. Preliminary program in this link. Registration is free but required.
Aim: Continuing the tradition started in 2019, provide a time and place where especially local people with interest in ALD can meet and get better networked.
Who should come: Researchers (doctoral, postdoctoral, other level) working with a connection to ALD, especially at Aalto University, and also beyond in Finland. Also company representatives welcome. In 2020, invited talks and two tutorials are organized as a Webinar, which is globally open for anyone interested to participate (registration required).
Format: The event will be organized remotely via Zoom. The program is divided in two parts.
Part 1: Public webinar will comprise of (i) high-level international invited talks (Dr. Jonas Sundqvist, Dr. Tuomo Suntola, Dr. Angel Yanguas-Gil) and (ii) tutorials (Prof. Riikka Puurunen, Prof. Matti Putkonen).
Part 2: Local networking will consist of (iii) brief introduction to groups working on ALD in Finland (feel free to contact the responsible organizer to have your Finland-based group added in this introduction), (iv) posters with optional ~2 min pitch talks by doctoral candidates and others working on ALD in Finland; posters in individual Zoom rooms, and (v) other presentations such as brief local company and project introductions.
Lecture capture: Presenters have the possibility to have their talk recorded with Zoom and shared through the Panopto system afterwards (live event; successful recording not guaranteed). After the event, the presenters will be asked for permission to share (no sharing/sharing within Aalto University/sharing openly with the link). No sharing is done without permission.
Organizing committee: Dr. Aitor Arandia Gutierrez, M.Sc. Milad Madadi, Prof. Riikka Puurunen (responsible organizer), Arja Tuohino-Chance, M.Sc. Emma Verkama, M.Sc. Jihong Yim. All from Aalto University, School of Chemical Engineering.
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Information of the 2019 event, the first event in the series November Networking - ALD at Aalto University: https://blogs.aalto.fi/catprofopen/ald-networking-nov-2019/
The Journal of Vacuum Science and Technology A is soliciting research articles for publication in Special Topic Collections on Atomic Layer Deposition and Atomic Layer Etching. These special topic collections are planned in collaboration with ALD 2020 and the ALE 2020 Workshop, which were held virtually on June 29—July 1, 2020.
Each year, in concert with the annual Atomic Layer Deposition (ALD) meeting and Atomic Layer Etching (ALE) Workshop, the Journal of Vacuum Science and Technology A publishes collections of articles covering the most recent developments and experimental studies in ALD and ALE. These ALD and ALE Special Topic Collections will include papers presented at ALD 2020 and the ALE 2020 Workshop, as well as other ALD and ALE research articles that were not presented at this conference but are submitted to the special collections. The Collections feature articles dedicated to the science and technology of atomic layer controlled deposition and etching.
Manuscript Deadline: November 18, 2020
Authors are encouraged to use the JVST article template. During submission, you will have an opportunity to tell us that your paper is a part of one of the Collections by choosing either the Special Topic or Conference Collection on “Atomic Layer Deposition (ALD)” or “Atomic Layer Etching (ALE).”
NordAmps in Lund,
Sweden, has developed InGaAs nanowire transistors with GAA high-k /metal gate (HKMG) capable of the high frequencies required for 5G and 6G data
transfer and logic data processing, with significantly lower energy
consumption.
The structures are fully compatible with a standard
300 mm standard Si CMOS flow and require less mask steps compared with
conventional technology.
NordAmps represents the convergence of research by global leaders in nanotechnology with leading edge application needs.
Source: NordAmps LINK
LEUVEN (Belgium, LINK) October 6, 2020 — Imec, a world-leading research and innovation hub in nanoelectronics and digital technologies, announced today promising results in extreme ultraviolet (EUV) reticle protection. Multiple CNT-based pellicles were mounted on reticles and exposed in the NXE:3300 EUV scanner at imec, demonstrating the successful fabrication and scanner handling of full-field CNT-based pellicles. The tested pellicles had a single-pass EUV transmission up to 97%. The impact on imaging was found to be low and correctable based on critical dimension (CD), dose, and transmission measurements.
A pellicle is a membrane used to protect the photomask from contamination during high-volume semiconductor manufacturing. It is mounted a few millimeters above the surface of the photomask so that if particles land on the pellicle, they will be too far out of focus to print. Developing such an EUV pellicle is very challenging, since 13.5nm light is absorbed by most materials. In addition, stringent thermal, chemical, and mechanical requirements must be achieved. Such highly transparent pellicle is critical to enable high yield and throughput in advanced semiconductor manufacturing.
Imec has leveraged partners in the semiconductor industry, materials companies and fundamental research to develop an innovative EUV pellicle design with potential to survive scanner powers beyond 600 Watts
“Imec has leveraged partners in the semiconductor industry, materials companies and fundamental research to develop an innovative EUV pellicle design with potential to survive scanner powers beyond 600 Watts,” said Emily Gallagher, principal member of technical staff at imec. “We have seen tremendous progress in carbon nanotube membrane development in the past year and, based on strong collaborations with our partners, are confident it will result in a high-performance pellicle solution in the near future.”
CNTs are one-atom-thick carbon sheets rolled into tubes. The CNTs can be single-, double- or multi-walled and can vary in diameter and in length. These engineered CNTs can be arranged in different configurations to form membranes of different densities. Since 2015, imec has been working with selected CNT suppliers (Canatu Oy and Lintec of America, Inc., Nano-Science & Technology Center) to develop membranes that meet the EUV pellicle targets for properties like transmittance, thermal durability, permeability, and strength and to enable the imaging results reported today. Future work will focus on achieving acceptable lifetimes for high volume manufacturing of these pellicles in scanners.