Wednesday, November 18, 2020

Japanese researchers enable high thru put conformal CVD for SiC on Silicon wafer integration

As reported by ACS (LINK) New, concise method proposed for conformal chemical vapor deposition using sacrificial layers (SLs). SLs are porous membranes that filter high sticking-probability species, while allow the passage of low ones.

This is a really clever by researchers at University of Tokyo and IHI Corporation for CVD to compete with ALD on conformality and keeping a high deposition rate and at the same time produce bulk material like SiC on Si for larger wafer diameter.


Figure from ACS Twitter post (LINK)

Reference:

Porous Membranes as Sacrificial Layers Enabling Conformal Chemical Vapor Deposition Involving Multiple Film-Forming Species
Kohei Shima, Yuichi Funato, Noboru Sato, Yasuyuki Fukushima, Takeshi Momose, and Yukihiro Shimogaki
ACS Appl. Mater. Interfaces 2020, 12, 45, 51016–51025
Publication Date:October 30, 2020
https://doi.org/10.1021/acsami.0c14069

No comments:

Post a Comment