Sunday, April 17, 2016

Applied Materials on the challenges of bringing new ALD Precursors to production

Here is an excellent interview with Dr. David Thompson, Senior Director, Center of Excellence in Chemistry,  Applied Materials on the challenges of bringing new ALD Precursors to production. For those of you who still have the possibility there will be a opportunity to meet and talk to David Thompson at the CMC Conference 5-6th of May (see details below).

Controlling Variabilities When Integrating IC Fab Materials

By Ed Korczynski, Senior Technical Editor, SemiMD/Solid State Technology,
copyright ©2016 Extension Media

Semiconductor integrated circuit (IC) manufacturing has always relied upon the supply of critical materials from a global supply chain. Now that shrinks of IC feature sizes have begun to reach economic limits, future functionality improvements in ICs are increasingly derived from the use of new materials. The Critical Materials Conference 2016—to be held May 5-6 in Hillsboro, Oregon (cmcfabs.org)—will explore best practices in the integration of novel materials into manufacturing. Dr. David Thompson, Senior Director, Center of Excellence in Chemistry, Applied Materials will present on “Agony in New Material Introductions – minimizing and correlating variabilities,” which he was willing to discuss in advance with SemiMD.

The full interview by By Ed Korczynski, Senior Technical Editor, SemiMD/Solid State Technology and Co-CHair of The CMC Conferecne is published in SemiMD and can be found here: http://semimd.com/blog/2016/04/15/controlling-variabilities-when-integrating-ic-fab-materials/  

 Buy Reports  | CMC Fabs   |  CMC Conference  |  Register Now

New Additions to a Powerful Lineup 
May 5-6, Hillsboro, Oregon


The Critical Materials Conference provides a framework to catalyze the flow of actionable technical and supply chain information related to critical materials. 

New Additions to the Critical Materials Conference Include: 

  • David Thompson, Ph.D., Director of Process Chemistry of Applied Materials
    • Agony in New Material Introductions - Minimizing and Correlating Variabilities
  • Toshi "Tommy" Oga, Ph.D., Gigaphoton Inc.
    • Neon Efficiency Improvement/Recycling
  • Dan Alvarez, Ph.D., Chief Technology Officer - RASIRC
    • Hydrazine as a Low Temperature Nitride Source: Materials Challenges for High Volume Manufacturing

A highly differentiated program, with networking opportunities for all attendees. 
For full agenda details click here.

Conference themes center around the Critical Materials Council and global IC fabrication industry needs. While executive conferences typically focus on the "what" and "why" of materials technologies, this conference also discusses "how" new materials can be controllably, safely, and cost-effectively used in fabs. Additionally the Conference includes market data to validate "when" materials will be needed. Attendees from fabs, OEMs, and materials suppliers alike have the opportunity to interact with the presenters and colleagues, to gain insights into the best practices of the entire supply-chain.

For more information on the conference go to www.cmcfabs.org/seminars/ 
Great Sponsorship Opportunities available, 
please contact cmcinfo@techcet.com or call 1-480-382-8336


Sponsors and Committee