JVST Publishes Fundamental and Applied Research Articles and Letters on Atomic Layer Deposition and Etching
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Recent Publications on ALD and ALE from JVST A and JVST B
Spectroscopic investigation of the electronic structure of thin atomic layer deposition HfO2 films
Silma Alberton Corrêa, Simone Brizzi and Dieter Schmeisser
Atomic layer deposition by reaction of molecular oxygen with tetrakisdimethylamido-metal precursors
J Provine, Peter Schindler, Jan
Torgersen, Hyo Jin Kim, Hans-Peter Karnthaler and Fritz B. Prinz
J. Vac. Sci. Technol. A 34, 01A138 (2016) |
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Standing and sitting adlayers in atomic layer deposition of ZnO
Zhengning Gao, Fei Wu, Yoon Myung,
Ruixiang Fei, Ravindra Kanjolia, Li Yang and Parag Banerjee
Improvement of the thermal
stability of nickel silicide using a ruthenium interlayer deposited via
remote plasma atomic layer deposition
Inhye Lee, Jingyu Park, Heeyoung
Jeon, Hyunjung Kim, Changhee Shin, Seokyoon Shin, Kunyoung Lee and
Hyeongtag Jeon
Growth per cycle of alumina atomic layer deposition on nano- and micro-powders
Kedar Manandhar, James A. Wollmershauser, Janice E. Boercker and Boris N. Feigelson
Growth, intermixing, and surface phase formation for zinc tin oxide nanolaminates produced by atomic layer deposition
Carl Hägglund, Thomas Grehl, Jukka
T. Tanskanen, Ye Sheng Yee, Marja N. Mullings, Adriaan J. M. Mackus,
Callisto MacIsaac, Bruce M. Clemens, Hidde H. Brongersma and Stacey F.
Bent
Atomic layer deposition of two dimensional MoS2 on 150 mm substrates
Arturo Valdivia, Douglas J. Tweet and John F. Conley Jr.
Initial evaluation and comparison of plasma damage to atomic layer carbon materials using conventional and low Te plasma sources
Ashish V. Jagtiani, Hiroyuki
Miyazoe, Josephine Chang, Damon B. Farmer, Michael Engel, Deborah
Neumayer, Shu-Jen Han, Sebastian U. Engelmann, David R. Boris, Sandra C.
Hernández, Evgeniya H. Lock, Scott G. Walton and Eric A. Joseph
Fluorocarbon assisted atomic layer etching of SiO2 and Si using cyclic Ar/C4F8 and Ar/CHF3 plasma
Dominik Metzler, Chen Li, Sebastian
Engelmann, Robert L. Bruce, Eric A. Joseph and Gottlieb S. Oehrlein
At the edge between metal
organic chemical vapor deposition and atomic layer deposition: Fast
Atomic Sequential Technique, for high throughput conformal deposition
Fabien Piallat and Julien Vitiello
J. Vac. Sci. Technol. B 34, 021202 (2016) |
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