As reported by Nanotech.org : The thermal conductivity of thin films can differ drastically from that
of bulk samples. With thin material layers increasingly being used in
microelectronic and optoelectronic components, measurement techniques
for determining the thermal conductivity are desirable. Additionally,
the potential to tune the thermal conductivity is interesting for
applications within the field of energy production. Reporting in Nanotechnology,
Finnish and Norwegian researchers determine the in-plane thermal
conductivity of thin films using the laser flash method. The work allows
for the study of thin films using standard measurement equipment that
is available in many research facilities.
Researchers at Aalto University and the University of Oslo use atomic layer deposition (ALD) to create a well-defined nanocomposite. This can be measured using the laser flash method.
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