Friday, May 8, 2015

Polycarbonate nanocomposite ALD coated device for measuring thermal conductivity in thin films

As reported by : The thermal conductivity of thin films can differ drastically from that of bulk samples. With thin material layers increasingly being used in microelectronic and optoelectronic components, measurement techniques for determining the thermal conductivity are desirable. Additionally, the potential to tune the thermal conductivity is interesting for applications within the field of energy production. Reporting in Nanotechnology, Finnish and Norwegian researchers determine the in-plane thermal conductivity of thin films using the laser flash method. The work allows for the study of thin films using standard measurement equipment that is available in many research facilities.

Researchers at Aalto University and the University of Oslo use atomic layer deposition (ALD) to create a well-defined nanocomposite. This can be measured using the laser flash method. 

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