In a recent article, researches from Germany (Bochum University) and Finland (Aalto University) explore the evolution and advancements in the atomic layer deposition (ALD) and molecular layer deposition (MLD) techniques for rare earth-based thin films, emphasizing their role in diverse applications ranging from microelectronics to optoelectronics and medical diagnostics. Initially focused on developing rare earth oxides as high-k dielectric materials in semiconductor devices, research has expanded to include complex ternary and quaternary perovskite oxides with unique magnetic and catalytic properties. The recent surge in ALD/MLD techniques has enabled the creation of rare earth-organic hybrid materials with intriguing luminescence properties, promising new avenues for applications in lighting, imaging, and solar cells.
The review also highlights the challenges associated with precursor development and the need for further research to optimize the chemical reactivity and long-term stability of these materials. The potential for these novel materials to revolutionize industries is significant, particularly in the creation of flexible devices and advanced optoelectronic applications. However, according to the article, achieving widespread industrial adoption will require continued collaboration between academia and industry to refine processes, enhance material performance, and ensure scalability.
Annually published ALD and ALD/MLD articles involving rare earth elements from 1992 to 2023. The publications were searched from Scopus and Web of Science, using search terms that included “atomic layer deposition” and “rare earth”, or “atomic layer deposition” and “lanthanide”. The data thus acquired were further manually refined to check for numbers as accurate as possible. Data were accessed lastly on 10-02-2024.
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