Breakthrough by Japanese Researchers - Block Copolymer Enables Ultra-Fine Semiconductor Patterns with 7.6 nm Half-Pitch

Scientists at Tokyo Institute of Technology and Tokyo Ohka Kogyo have developed a novel block copolymer (BCP) that could significantly advance semiconductor manufacturing by enabling finer circuit patterns through directed self-assembly (DSA). This new BCP, derived from a chemically tailored version of polystyrene-block-poly(methyl methacrylate) (PS-b-PMMA), self-assembles into lamellar structures with a half-pitch size of just 7.6 nanometers. This surpasses the capabilities of conventional BCPs, which struggle to achieve sub-10 nm features, and represents one of the smallest reported half-pitch sizes in the world for thin-film lamellar structures.

a Schematic of the DSA process using a PS-b-PGFM on a chemically patterned Si substrate. AFM phase images of a b PS-b-PGFM19-23 film on an NL35-modified DSA substrate (Ls = 90 nm) after annealing at 240 °C for 5 min, c PS-b-PGFM19-10 film on an NL38-modified DSA substrate (Ls = 84 nm) after annealing at 230 °C for 5 min, and d PS-b-PGFM18-11 film on an NL38-modified DSA substrate (Ls = 90 nm) after annealing at 230 °C for 5 min. All thin films are 19-nm thick and were etched using O2 plasma for 10 s prior to AFM.

The research, published in *Nature Communications*, highlights the potential of this new BCP to push the boundaries of miniaturization in electronics, which is crucial for the continued advancement of semiconductor technology. The tailored copolymer, PS-b-PGFM, exhibits reliable and reproducible self-assembly into extremely small nanometric patterns, making it a promising template for lithographic processes. As the demand for smaller feature sizes in semiconductor devices grows, this breakthrough could pave the way for next-generation Logic and Memory components that all need to continuously scale to smaller critical dimensions.

Sources:

Advances in Semiconductor Patterning: New Block Copolymer Achieves 7.6nm Line Width - Semiconductor Digest (semiconductor-digest.com)

Chemically tailored block copolymers for highly reliable sub-10-nm patterns by directed self-assembly | Nature Communications