Unlocking the secrets of conformality, Characterization

Are you eager to learn more about 3D thin films Characterization in high aspect ratio structures and the tools essential for achieving this? The most insightful answers will be provided from high level experienced thin film characterization expert Dr. Jennifer S. Emara, the thin film characterization specialist at Fraunhofer IPMS and Dr. Jussi Kinnunen, the Optical measurement specialist at Chipmetrics.

Event Timing: Sept 28th, 2023. 5 pm CET (Europe), 8 am PST (USA)

Contact us at (+358417401098) or info@chipmetrics.com