The following articles are free to download for next 30 days:
Quasi-atomic layer etching of silicon nitride
Sonam D. Sherpa and Alok Ranjan
J. Vac. Sci. Technol., A 35, 01A102 (2017) |
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Predicting synergy in atomic layer etching
Keren J. Kanarik, Samantha Tan, Wenbing Yang,
Taeseung Kim, Thorsten Lill, Alexander Kabansky, Eric A. Hudson,
Tomihito Ohba, Kazuo Nojiri, Jengyi Yu, Rich Wise, Ivan L. Berry, Yang
Pan, Jeffrey Marks, and Richard A. Gottscho
J. Vac. Sci. Technol., A 35, 05C302 (2017) |
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Atomic layer etching of SiO2 by alternating an O2 plasma with fluorocarbon film deposition
Takayoshi Tsutsumi, Hiroki Kondo, Masaru Hori,
Masaru Zaitsu, Akiko Kobayashi, Toshihisa Nozawa, and Nobuyoshi
Kobayashi
J. Vac. Sci. Technol., A 35, 01A103 (2017) |
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Review Article: Plasma-surface interactions at the atomic scale for patterning metals
Nicholas D. Altieri, Jack Kun-Chieh Chen, Luke Minardi, and Jane P. Chang
J. Vac. Sci. Technol., A 35, 05C203 (2017) |
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Atomic layer etching in close-to-conventional plasma etch tools
Andy Goodyear and Mike Cooke
J. Vac. Sci. Technol., A 35, 01A105 (2017) |
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Correcting defects in area selective molecular layer deposition
Richard G. Closser, David S. Bergsman, Luis Ruelas, Fatemeh Sadat Minaye Hashemi, and Stacey F. Bent
J. Vac. Sci. Technol., A 35, 031509 (2017) |
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Revisiting the growth mechanism of atomic layer deposition of Al2O3: A vibrational sum-frequency generation study
Vincent Vandalon and W. M. M. (Erwin) Kessels
J. Vac. Sci. Technol., A 35, 05C313 (2017) |
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High-k oxides by atomic layer deposition-Applications in biology and medicine
Marek Godlewski, Sylwia Gierałtowska, Łukasz
Wachnicki, Rafał Pietuszka, Bartłomiej S. Witkowski, Anna Słońska,
Zdzisław Gajewski, and Michał M. Godlewski
J. Vac. Sci. Technol., A 35, 021508 (2017) |
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Atomic layer deposition of h-BN(0001) on RuO2(110)/Ru(0001)
Jessica Jones, Brock Beauclair, Opeyemi
Olanipekun, Sherard Lightbourne, Mofei Zhang, Brittany Pollok, Aparna
Pilli, and Jeffry Kelber
J. Vac. Sci. Technol., A 35, 01B139 (2017) |
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Atomic fluorine densities in electron beam
generated plasmas: A high ion to radical ratio source for etching with
atomic level precision
David R. Boris, Tzvetelina B. Petrova, George M. Petrov, and Scott G. Walton
J. Vac. Sci. Technol., A 35, 01A104 (2017) |
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