Thursday, July 4, 2019

Integrated Process Monitoring for New Memories (MRAM, PCRAM, ReRAM) by Applied Materials

[Applied Materials] For new memories to reach high-volume manufacturing, the industry must enable new process control solutions says Applied’s Niranjan Khasgiwale. Read his latest blog to find out what’s driving the need for new metrology techniques.

Applied Materials: LINK 

 

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