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This exclusive workshop provides opportunity to learn about Angstrom scale metrology of ALD thin films in ultra High Aspect Ratio structures. In addition, it gives insights of most advanced rapid analytical methods of ALD conformality.
This unique educational opportunity is being held in the fascinating venue in the lake district of Finland.
Workshop flyer and program can be downloaded from here:
Registration Fee: €650
Date: Thursday, 8th August 2024
Location: Vainoniemi villa, Joensuu, Finland
Contact us at +358 41 740 1098 or zahra.ghaderi@chipmetrics.com
The workshop is an excellent opportunity to network, share expertise, and keep current with the quickly changing field of semiconductor metrology. Therefore, many students approach to the best and reliable MBA dissertation writers to enhance writing skills for updating projects on time.
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